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Assessment
Shape, size, Agglomeration state
- Field Emission Gun Scanning Electron Microscopy with STEM detector (FEI, Nova NanoSEM 450 for S(T)EM/EDX analysis))
Particle Size Distribution
- Differential Centrifugal Sedimentation (CPS)
- Laser Diffraction
- Dynamic Light Scattering (DLS) (ZetaSizer)
- Nanoparticle Traching Analysis (NTA) (NanoSight)
Specific Surface Area
- N2 adsorption – BET analysis
Zetapotential
- Dynamic Light Scattering (DLS) (ZetaSizer)
- Nanoparticle Tracking Analysis (NTA) (NanoSight)
Phase Identification, crystallite size
- X-ray Diffraction (XRD)
Elemental analysis
- High temperature/pressure digestion and determination of the elemental content by Inductively coupled plasma mass spectrometry (ICP-MS) or inductively coupled plasma optical emission spectrometry (ICP-OES)
- Energy-dispersive X-ray fluorescence (EDXRF)
- < > X-ray fluorescence (XRF) spot size 30 µm – 1 mm – 2 mm
Services
Nano aerosol exposure assessment in occupational settings
- Source identification
- Determination of worker exposure in occupational settings
- Contribution to safe innovation (Exposure scenario's, exposure Measurements, Risk Management Measures)
- Implement Control Banding Tools