We have innovated and developed analytical strategies to answer our clients’ unique questions about characterisation.

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Shape, size, Agglomeration state

  • Field Emission Gun Scanning Electron Microscopy with STEM detector (FEI, Nova NanoSEM 450 for S(T)EM/EDX analysis))

Particle Size Distribution

  • Differential Centrifugal Sedimentation (CPS)
  • Laser Diffraction
  • Dynamic Light Scattering (DLS) (ZetaSizer)
  • Nanoparticle Traching Analysis (NTA) (NanoSight)

Specific Surface Area

  • N2 adsorption – BET analysis


  • Dynamic Light Scattering (DLS) (ZetaSizer)
  • Nanoparticle Tracking Analysis (NTA) (NanoSight)

Phase Identification, crystallite size

  • X-ray Diffraction (XRD)

Elemental analysis

  • High temperature/pressure digestion and determination of the elemental content by Inductively coupled plasma mass spectrometry (ICP-MS) or inductively coupled plasma optical emission spectrometry (ICP-OES).
  • Energy-dispersive X-ray fluorescence (XRF)
  • µ- X-ray fluorescence (XRF) spot size 30 µm – 1 mm – 2 mm

Our expert

Annick Vanhulsel, PhD

Project manager
+32 14 33 56 19