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We have innovated and developed analytical strategies to answer our clients’ unique questions about characterisation.
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Assessment
Shape, size, Agglomeration state
- Field Emission Gun Scanning Electron Microscopy with STEM detector (FEI, Nova NanoSEM 450 for S(T)EM/EDX analysis))
Particle Size Distribution
- Differential Centrifugal Sedimentation (CPS)
- Laser Diffraction
- Dynamic Light Scattering (DLS) (ZetaSizer)
- Nanoparticle Traching Analysis (NTA) (NanoSight)
Specific Surface Area
- N2 adsorption – BET analysis
Zetapotential
- Dynamic Light Scattering (DLS) (ZetaSizer)
- Nanoparticle Tracking Analysis (NTA) (NanoSight)
Phase Identification, crystallite size
- X-ray Diffraction (XRD)
Elemental analysis
- High temperature/pressure digestion and determination of the elemental content by Inductively coupled plasma mass spectrometry (ICP-MS) or inductively coupled plasma optical emission spectrometry (ICP-OES).
- Energy-dispersive X-ray fluorescence (XRF)
- µ- X-ray fluorescence (XRF) spot size 30 µm – 1 mm – 2 mm
